Ex-Core Neutron Irradiation Facility
Ex-Core Neutron Irradiation FacilityENF Ex-core Neutron irradiation Facility
- The Ex-Core Neutron Irradiation Facility (ENF) in its early days was used for experiments on boron neutron capture therapy (BNCT), but now it has more diverse purposes including thermal neutron imaging and irradiation experiments. Its relatively high thermal neutron flux is useful for high-resolution neutron imaging experiments with 3D metal printed samples, cultural heritage samples, secondary batteries, etc. In particular, Samsung Electronics is conducting soft error rate (SER) properties tests and analyses on the advanced development process by applying thermal neutron irradiation to semiconductors.
Contact information
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Jongyul KimSenior researcherNeutron Science Division+82-42-868-8744
Applications
- Neutron irradiation test
- Neutron detector evaluation test
- Neutron phase-contrast imaging experiment
- Neutron dark-field imaging experiment
- Neutron energy selective imaging experiment
- X-ray & Neutron hybrid imaging experiment
Representative Results
- Magnetic domain visualization of Fe-Si samples using neutron dark-field imaging
- Soft Error Rate evaluation of semiconductor memory chip using thermal neutron irradiation