Vertical-Type Neutron Reflectometer
Vertical-Type Neutron ReflectometerREF-V Vertical Type Neutron Reflectometer
- Neutron beams arriving in a very small angle of incidence around the critical angel of samples will be reflected in the same angle as the incidence. The vertical-type neutron reflectometer (REF-V) measures the degree of mirror reflection based on the degree of reflective angle and analyzes the pattern of reflection to obtain data about the microstructure of thin-film materials. HANARO offers to users from outside a REF-V, in which samples are installed in an upright position. This reflectometer is used for studies of thin-film structures in a wide range of materials such as semiconductor/magnetic nano-materials, quantum computing/spintronics materials, secondary/solar/fuel-cell batteries, and polymers.
Contact information
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Junehyuk LeePrincipal researcherNeutron Science Division+82-42-868-4660
Specification
| REF-V | |
|---|---|
| Location | CNLB CG1A |
| Reflection plane | Vertical |
| Monochromator | 7 PG(002) focused, β=0.4°, LN2cooled Be |
| Wavelength, Δλ / λ | 4.7535 ± 0.001 Å |
| Q range, ΔQ / Q | 0.003 ~ 0.3 Å−1, > 2.0% at slit width 1.5mm |
| Min. reflectivity | ~10-6 |
| Neutron flux (n/cm2/sec) | ~1.0 x 106 |
| Detector | Hellum-3 Single |
Sample Environments
DetectorVacuum furnace (~250C)
Electrochemical cell
Electromagnet (~1T)Research Area
- Nanoscale structure of polymer
- Adsorption of surfactant and polymer
- Morphology of 2D materials (Graphene, TMDs)
- Evolution of Li-ion battery electrode interface
Representative Results
- J. H. Lee et al., Adv. Funct. Mater., (2023) 2215221
- J. Koo et al., RSC Adv., 6 (2016) 55842
- H. Kim et al., Langmuir, 30 (2014) 2170
- J. G. Son et al., Macromolecules, 45 (2012) 150